SESSION E - ADVANCED METHODS OF PREPARATION AND CHARACTERIZATION OF NANOMATERIALS

Date: October 18, 2018

Metrology/Measuring
11:05 - 11:35
E1
VANDERVORST Wilfried
Catholic University of Leuven, Leuven, Belgium, EU
Metrology for Nanoscale Complex Semiconductor Systems - INVITED LECTURE
11:35 - 11:50
E2
CHARVÁTOVÁ CAMPBELL Anna
Czech Metrology Institute, Brno, Czech Republic, EU
Calibration of Area Function for Nanoindentation on Nanomaterials
11:50 - 12:05
E3
HAVLÍČEK Marek
Brno University of Technology - CEITEC, Brno, Czech Republic, EU
Calibration Standards for Quantitative Magnetic Force Microscopy
12:05 - 12:20
E4
ŠEC Karel
Nicolet CZ, Prague, Czech Republic, EU
Imaging and Spectroscopy at 10nm Spatial Resolution using s-SNOM - COMMERCIAL PRESENTATION
12:20 - 12:35
E5
NEUMAN Jan
NenoVision s.r.o., Brno, Czech Republic, EU
LiteScope™ AFM-in-SEM: New Applications and Tools for In-situ Sample Analyses - COMMERCIAL PRESENTATION

Date: October 19, 2018

Nanocharacterization/Techniques
09:00 - 09:30
E6
UHLÍŘ Vojtěch
Brno University of Technology - CEITEC, Brno, Czech Republic, EU
Emergence and Dynamics of Magnetic Order in Metamagnetic Nanostructures - INVITED LECTURE
09:30 - 09:45
E7
SANTHINI Vijai Meena
Institute of Physics of the CAS, Prague, Czech Republic, EU
On Surface Formation of 1D Polyferrocenylene Chains on Metal Surfaces with Peculiar Structural and Electronic Properties
09:45 - 10:00
E8
SCHUMMER Bernhard
University of Würzburg, Würzburg, Germany, EU
Stabilization of Cadmium Sulfide Nanoparticles using Block-Copolymers
10:00 - 10:15
E9
KRÁL Petr
Institute of Physics of Materials of the CAS, Brno, Czech Republic, EU
Microstructure Refinement in Martensitic Creep Resistant Steel Using Severe Plastic Deformation
10:15 - 10:30
E10
KLÍMEK Petr
TESCAN ORSAY HOLDING, a.s., Brno, Czech Republic, EU
TESCAN S8000G FIB-SEM and its Strong Advantages in Material Characterization - COMMERCIAL PRESENTATION
10:30 - 10:50
COFFEE BREAK
Nanocharacterization/Measuring
10:50 - 11:20
E11
SOCHOR Benedikt
Universtiy of Würzburg, Würzburg, Germany, EU
Determination of Micellar Aggregation Number Using Small-angle-X-ray-scattering with Absolute Calibrated Intensities and Densometry
11:20 - 11:35
E12
BYCHENKO Maria
Gubkin University, Moscow, Russian Federation
Controlled Aggregation of Metal Nanoparticles for Preparation of SERS Substrates
11:35 - 11:50
E13
PAVLÍČEK Herbert
Carl Zeiss Ltd. , Prague, Czech Republic, EU
Correlative Workflows with X-rays, Electron and Ion Beams: Correlation of Structure and Chemistry in Li-ion Batteries - COMMERCIAL PRESENTATION
11:50 - 12:05
E14
KRUML Tomáš
Institute of Physics of Materials of the CAS, Brno, Czech Republic, EU
Numerical Analysis of Plasticity Effect in Free Standing Membrane during the Bulge Test
12:30 - 12:45
ANNOUNCEMENT OF THE DR. PRNKA PRIZE

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